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Substrate Partitioning Scheme for Compact Charge Modeling of Multigate MOSFETs

A modeling approach for the charge-voltage characteristics of multigate metal-oxide-semiconductor field-effect transistors with complicated cross sections is proposed. Using solutions of linear equations, the substrate region is partitioned into several 1-D MOS structures and the coupling capacitanc...

詳細記述

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書誌詳細
主要な著者: Sung-Min Hong, Junsung Park
フォーマット: Artigo
言語:Inglês
出版事項: IEEE 2017-01-01
シリーズ:IEEE Journal of the Electron Devices Society
主題:
オンライン・アクセス:https://ieeexplore.ieee.org/document/7880655/
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