Lataa...
Noise analysis for through-focus scanning optical microscopy
A systematic noise-analysis study for optimizing data collection and data processing parameters for through-focus scanning optical microscopy (TSOM) is presented. TSOM is a three-dimensional shape metrology method that can achieve sub-nanometer measurement sensitivity by analyzing sets of images acq...
Tallennettuna:
| Julkaisussa: | Opt Lett |
|---|---|
| Päätekijä: | |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
2016
|
| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4823012/ https://ncbi.nlm.nih.gov/pubmed/26872178 |
| Tagit: |
Lisää tagi
Ei tageja, Lisää ensimmäinen tagi!
|