Yüklüyor......
Noise analysis for through-focus scanning optical microscopy
A systematic noise-analysis study for optimizing data collection and data processing parameters for through-focus scanning optical microscopy (TSOM) is presented. TSOM is a three-dimensional shape metrology method that can achieve sub-nanometer measurement sensitivity by analyzing sets of images acq...
Kaydedildi:
| Yayımlandı: | Opt Lett |
|---|---|
| Yazar: | |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
2016
|
| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4823012/ https://ncbi.nlm.nih.gov/pubmed/26872178 |
| Etiketler: |
Etiketle
Etiket eklenmemiş, İlk siz ekleyin!
|