Učitavanje...
Noise analysis for through-focus scanning optical microscopy
A systematic noise-analysis study for optimizing data collection and data processing parameters for through-focus scanning optical microscopy (TSOM) is presented. TSOM is a three-dimensional shape metrology method that can achieve sub-nanometer measurement sensitivity by analyzing sets of images acq...
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| Izdano u: | Opt Lett |
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| Glavni autor: | |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
2016
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4823012/ https://ncbi.nlm.nih.gov/pubmed/26872178 |
| Oznake: |
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