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Solution-Processed Gallium–Tin-Based Oxide Semiconductors for Thin-Film Transistors

We investigated the effects of gallium (Ga) and tin (Sn) compositions on the structural and chemical properties of Ga–Sn-mixed (Ga:Sn) oxide films and the electrical properties of Ga:Sn oxide thin-film transistors (TFTs). The thermogravimetric analysis results indicate that solution-processed oxide...

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Publicat a:Materials (Basel)
Autors principals: Zhang, Xue, Lee, Hyeonju, Kim, Jungwon, Kim, Eui-Jik, Park, Jaehoon
Format: Artigo
Idioma:Inglês
Publicat: MDPI 2017
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC5793544/
https://ncbi.nlm.nih.gov/pubmed/29283408
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma11010046
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