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Uncovering edge states and electrical inhomogeneity in MoS(2) field-effect transistors

The understanding of various types of disorders in atomically thin transition metal dichalcogenides (TMDs), including dangling bonds at the edges, chalcogen deficiencies in the bulk, and charges in the substrate, is of fundamental importance for TMD applications in electronics and photonics. Because...

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Publicat a:Proc Natl Acad Sci U S A
Autors principals: Wu, Di, Li, Xiao, Luan, Lan, Wu, Xiaoyu, Li, Wei, Yogeesh, Maruthi N., Ghosh, Rudresh, Chu, Zhaodong, Akinwande, Deji, Niu, Qian, Lai, Keji
Format: Artigo
Idioma:Inglês
Publicat: National Academy of Sciences 2016
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC4978287/
https://ncbi.nlm.nih.gov/pubmed/27444021
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1605982113
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