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On current transients in MoS(2) Field Effect Transistors

We present an experimental investigation of slow transients in the gate and drain currents of MoS(2)-based transistors. We focus on the measurement of both the gate and drain currents and, from the comparative analysis of the current transients, we conclude that there are at least two independent tr...

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Podrobná bibliografie
Vydáno v:Sci Rep
Hlavní autoři: Macucci, Massimo, Tambellini, Gerry, Ovchinnikov, Dmitry, Kis, Andras, Iannaccone, Giuseppe, Fiori, Gianluca
Médium: Artigo
Jazyk:Inglês
Vydáno: Nature Publishing Group UK 2017
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC5599678/
https://ncbi.nlm.nih.gov/pubmed/28912464
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-017-11930-6
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