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Uncovering edge states and electrical inhomogeneity in MoS(2) field-effect transistors

The understanding of various types of disorders in atomically thin transition metal dichalcogenides (TMDs), including dangling bonds at the edges, chalcogen deficiencies in the bulk, and charges in the substrate, is of fundamental importance for TMD applications in electronics and photonics. Because...

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Pubblicato in:Proc Natl Acad Sci U S A
Autori principali: Wu, Di, Li, Xiao, Luan, Lan, Wu, Xiaoyu, Li, Wei, Yogeesh, Maruthi N., Ghosh, Rudresh, Chu, Zhaodong, Akinwande, Deji, Niu, Qian, Lai, Keji
Natura: Artigo
Lingua:Inglês
Pubblicazione: National Academy of Sciences 2016
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Accesso online:https://ncbi.nlm.nih.gov/pmc/articles/PMC4978287/
https://ncbi.nlm.nih.gov/pubmed/27444021
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1605982113
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