A carregar...

High-pressure Gas Activation for Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistors at 100 °C

We investigated the use of high-pressure gases as an activation energy source for amorphous indium-gallium-zinc-oxide (a-IGZO) thin film transistors (TFTs). High-pressure annealing (HPA) in nitrogen (N(2)) and oxygen (O(2)) gases was applied to activate a-IGZO TFTs at 100 °C at pressures in the rang...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Kim, Won-Gi, Tak, Young Jun, Du Ahn, Byung, Jung, Tae Soo, Chung, Kwun-Bum, Kim, Hyun Jae
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group 2016
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4789782/
https://ncbi.nlm.nih.gov/pubmed/26972476
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep23039
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!