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Resistive switching behavior in Lu(2)O(3) thin film for advanced flexible memory applications

In this article, the resistive switching (RS) behaviors in Lu(2)O(3) thin film for advanced flexible nonvolatile memory applications are investigated. Amorphous Lu(2)O(3) thin films with a thickness of 20 nm were deposited at room temperature by radio-frequency magnetron sputtering on flexible polye...

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Detaylı Bibliyografya
Asıl Yazarlar: Mondal, Somnath, Her, Jim-Long, Koyama, Keiichi, Pan, Tung-Ming
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: Springer 2014
Konular:
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC3895690/
https://ncbi.nlm.nih.gov/pubmed/24387704
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-9-3
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