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Reliability characteristics and conduction mechanisms in resistive switching memory devices using ZnO thin films
In this work, bipolar resistive switching characteristics were demonstrated in the Pt/ZnO/Pt structure. Reliability tests show that ac cycling endurance level above 10(6 )can be achieved. However, significant window closure takes place after about 10(2 )dc cycles. Data retention characteristic exhib...
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer
2012
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3325859/ https://ncbi.nlm.nih.gov/pubmed/22401297 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-178 |
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