Introduction to the special issue on high-resolution X-ray diffraction and imaging

Por Chamard, Virginie, Holý, Václav
Publicado no J Appl Crystallogr (2017)

Powder diffraction in Bragg–Brentano geometry with straight linear detectors

Por Kriegner, Dominik, Matěj, Zdeněk, Kužel, Radomír, Holý, Václav
Publicado no J Appl Crystallogr (2015)

Grazing-incidence small-angle X-ray scattering: application to the study of quantum dot lattices

Por Buljan, Maja, Radić, Nikola, Bernstorff, Sigrid, Dražić, Goran, Bogdanović-Radović, Iva, Holý, Václav
Publicado em 2012

Twin domain imaging in topological insulator Bi(2)Te(3) and Bi(2)Se(3) epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

Por Kriegner, Dominik, Harcuba, Petr, Veselý, Jozef, Lesnik, Andreas, Bauer, Guenther, Springholz, Gunther, Holý, Václav
Publicado no J Appl Crystallogr (2017)

Structure Quality of LuFeO(3) Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt

Por Bauer, Sondes, Rodrigues, Adriana, Horák, Lukáš, Jin, Xiaowei, Schneider, Reinhard, Baumbach, Tilo, Holý, Václav
Publicado no Materials (Basel) (2019)

The instrumental resolution of a moire extensometer in light of its recent automatisation

Por Rowberry, Matt D., Kriegner, Dominik, Holy, Vaclav, Frontera, Carlos, Llull, Miquel, Olejnik, Kamil, Marti, Xavi
Publicado no Measurement (Lond) (2016)

X-ray diffraction strain analysis of a single axial InAs(1–x)P(x) nanowire segment

Por Keplinger, Mario, Mandl, Bernhard, Kriegner, Dominik, Holý, Václav, Samuelsson, Lars, Bauer, Günther, Deppert, Knut, Stangl, Julian
Publicado no J Synchrotron Radiat (2015)

Indium Incorporation into InGaN Quantum Wells Grown on GaN Narrow Stripes

Por Sarzyński, Marcin, Grzanka, Ewa, Grzanka, Szymon, Targowski, Grzegorz, Czernecki, Robert, Reszka, Anna, Holy, Vaclav, Nitta, Shugo, Liu, Zhibin, Amano, Hiroshi, Leszczyński, Mike
Publicado no Materials (Basel) (2019)

Characterization of individual stacking faults in a wurtzite GaAs nanowire by nanobeam X-ray diffraction

Por Davtyan, Arman, Lehmann, Sebastian, Kriegner, Dominik, Zamani, Reza R., Dick, Kimberly A., Bahrami, Danial, Al-Hassan, Ali, Leake, Steven J., Pietsch, Ullrich, Holý, Václav
Publicado no J Synchrotron Radiat (2017)

Structural investigations of the α(12) Si–Ge superstructure

Por Etzelstorfer, Tanja, Ahmadpor Monazam, Mohammad Reza, Cecchi, Stefano, Kriegner, Dominik, Chrastina, Daniel, Gatti, Eleonora, Grilli, Emanuele, Rosemann, Nils, Chatterjee, Sangam, Holý, Vaclav, Pezzoli, Fabio, Isella, Giovanni, Stangl, Julian
Publicado no J Appl Crystallogr (2015)

Ferroelectric phase transition in multiferroic Ge(1−x)Mn(x)Te driven by local lattice distortions

Por Kriegner, Dominik, Furthmüller, Jürgen, Kirchschlager, Raimund, Endres, Jan, Horak, Lukas, Cejpek, Petr, Reichlova, Helena, Marti, Xavier, Primetzhofer, Daniel, Ney, Andreas, Bauer, Günther, Bechstedt, Friedhelm, Holy, Vaclav, Springholz, Gunther
Publicado no Phys Rev B (2016)

X-ray Nanodiffraction on a Single SiGe Quantum Dot inside a Functioning Field-Effect Transistor

Por Hrauda, Nina, Zhang, Jianjun, Wintersberger, Eugen, Etzelstorfer, Tanja, Mandl, Bernhard, Stangl, Julian, Carbone, Dina, Holý, Vaclav, Jovanović, Vladimir, Biasotto, Cleber, Nanver, Lis K., Moers, Jürgen, Grützmacher, Detlev, Bauer, Günther
Publicado em 2011

X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

Por Davtyan, Arman, Kriegner, Dominik, Holý, Václav, AlHassan, Ali, Lewis, Ryan B., McDermott, Spencer, Geelhaar, Lutz, Bahrami, Danial, Anjum, Taseer, Ren, Zhe, Richter, Carsten, Novikov, Dmitri, Müller, Julian, Butz, Benjamin, Pietsch, Ullrich
Publicado no J Appl Crystallogr (2020)