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X-ray diffraction strain analysis of a single axial InAs(1–x)P(x) nanowire segment
The spatial strain distribution in and around a single axial InAs(1–x)P(x) hetero-segment in an InAs nanowire was analyzed using nano-focused X-ray diffraction. In connection with finite-element-method simulations a detailed quantitative picture of the nanowire’s inhomogeneous strain state was achie...
Guardat en:
| Publicat a: | J Synchrotron Radiat |
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| Autors principals: | , , , , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
International Union of Crystallography
2015
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4294024/ https://ncbi.nlm.nih.gov/pubmed/25537589 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S160057751402284X |
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