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Introduction to the special issue on high-resolution X-ray diffraction and imaging
The latest virtual special issue of Journal of Applied Crystallography features some highlights of the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016), held in Brno, Czech Republic, in September 2016.
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| Publicado no: | J Appl Crystallogr |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5458585/ https://ncbi.nlm.nih.gov/pubmed/28656031 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576717007257 |
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