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XTOP: high-resolution X-ray diffraction and imaging
The latest virtual special issue of Journal of Applied Crystallography includes some highlights of the 12th Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), which took place in Villard-de-Lans and Grenoble in September 2014.
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| 出版年: | J Appl Crystallogr |
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| 主要な著者: | , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
International Union of Crystallography
2015
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4453967/ https://ncbi.nlm.nih.gov/pubmed/26089754 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S160057671500895X |
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