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High-resolution X-ray diffraction with no sample preparation
It is shown that energy-dispersive X-ray diffraction (EDXRD) implemented in a back-reflection geometry is extremely insensitive to sample morphology and positioning even in a high-resolution configuration. This technique allows high-quality X-ray diffraction analysis of samples that have not been pr...
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| 發表在: | Acta Crystallogr A Found Adv |
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| Main Authors: | , , , |
| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
International Union of Crystallography
2017
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| 主題: | |
| 在線閱讀: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5571747/ https://ncbi.nlm.nih.gov/pubmed/28660862 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2053273317008592 |
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