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High-resolution X-ray diffraction and imaging
This issue of Journal of Applied Crystallography includes some highlights of the 11th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP), held in St Petersburg in 2012.
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| Hlavní autoři: | , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
International Union of Crystallography
2013
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3769075/ https://ncbi.nlm.nih.gov/pubmed/24046485 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0021889813016415 |
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