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Structure Quality of LuFeO(3) Epitaxial Layers Grown by Pulsed-Laser Deposition on Sapphire/Pt
Structural quality of LuFeO [Formula: see text] epitaxial layers grown by pulsed-laser deposition on sapphire substrates with and without platinum Pt interlayers has been investigated by in situ high-resolution X-ray diffraction (reciprocal-space mapping). The parameters of the structure such as siz...
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| Udgivet i: | Materials (Basel) |
|---|---|
| Main Authors: | , , , , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
MDPI
2019
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6982296/ https://ncbi.nlm.nih.gov/pubmed/31877688 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma13010061 |
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