Twin domain imaging in topological insulator Bi(2)Te(3) and Bi(2)Se(3) epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction

Por Kriegner, Dominik, Harcuba, Petr, Veselý, Jozef, Lesnik, Andreas, Bauer, Guenther, Springholz, Gunther, Holý, Václav
Publicado no J Appl Crystallogr (2017)