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Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique

We investigate the sensitivity of symmetry quantification algorithms based on the profile R-factor (R(p)) and the normalized cross-correlation (NCC) coefficient (γ). A DM (Digital Micrograph(©)) script embedded in the Gatan digital microscopy software is used to develop the symmetry quantification p...

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Detalhes bibliográficos
Publicado no:Appl Microsc
Main Authors: So, Hyeongsub, Lee, Ro Woon, Hong, Sung Taek, Kim, Kyou-Hyun
Formato: Artigo
Idioma:Inglês
Publicado em: Springer Singapore 2021
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC8254841/
https://ncbi.nlm.nih.gov/pubmed/34216303
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s42649-021-00060-z
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