Comparison of convergent beam electron diffraction and annular bright field atomic imaging for GaN polarity determination

A comparison of two electron microscopy techniques used to determine the polarity of GaN nanowires is presented. The techniques are convergent beam electron diffraction (CBED) in TEM mode and annular bright field (ABF) imaging in aberration corrected STEM mode. Both measurements were made at nominal...

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Bibliografiska uppgifter
I publikationen:J Mater Res
Huvudupphovsmän: Roshko, Alexana, Brubaker, Matt D., Blanchard, Paul T., Bertness, Kris A., Harvey, Todd E., Geiss, Roy H., Levin, Igor
Materialtyp: Artigo
Språk:Inglês
Publicerad: 2017
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Article
Länkar:https://ncbi.nlm.nih.gov/pmc/articles/PMC6604648/
https://ncbi.nlm.nih.gov/pubmed/31274956
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1557/jmr.2016.443
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