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Three-beam convergent-beam electron diffraction for measuring crystallographic phases
Under almost all circumstances, electron diffraction patterns contain information about the phases of structure factors, a consequence of the short wavelength of an electron and its strong Coulombic interaction with matter. However, extracting this information remains a challenge and no generic meth...
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| Vydáno v: | IUCrJ |
|---|---|
| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
International Union of Crystallography
2018
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6211523/ https://ncbi.nlm.nih.gov/pubmed/30443359 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252518012216 |
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