Cargando...
Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
We investigate the sensitivity of symmetry quantification algorithms based on the profile R-factor (R(p)) and the normalized cross-correlation (NCC) coefficient (γ). A DM (Digital Micrograph(©)) script embedded in the Gatan digital microscopy software is used to develop the symmetry quantification p...
Gardado en:
| Publicado en: | Appl Microsc |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Springer Singapore
2021
|
| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8254841/ https://ncbi.nlm.nih.gov/pubmed/34216303 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s42649-021-00060-z |
| Tags: |
Engadir etiqueta
Sen Etiquetas, Sexa o primeiro en etiquetar este rexistro!
|