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Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique
We investigate the sensitivity of symmetry quantification algorithms based on the profile R-factor (R(p)) and the normalized cross-correlation (NCC) coefficient (γ). A DM (Digital Micrograph(©)) script embedded in the Gatan digital microscopy software is used to develop the symmetry quantification p...
Tallennettuna:
| Julkaisussa: | Appl Microsc |
|---|---|
| Päätekijät: | , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Springer Singapore
2021
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC8254841/ https://ncbi.nlm.nih.gov/pubmed/34216303 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s42649-021-00060-z |
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