एपीए उद्धरण

So, H., Lee, R. W., Hong, S. T., & Kim, K. (2021). Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique. Appl Microsc.

शिकागो स्टाइल उद्धरण

So, Hyeongsub, Ro Woon Lee, Sung Taek Hong, और Kyou-Hyun Kim. "Sensitivity of Quantitative Symmetry Measurement Algorithms for Convergent Beam Electron Diffraction Technique." Appl Microsc 2021.

एमएलए उद्धरण

So, Hyeongsub, Ro Woon Lee, Sung Taek Hong, और Kyou-Hyun Kim. "Sensitivity of Quantitative Symmetry Measurement Algorithms for Convergent Beam Electron Diffraction Technique." Appl Microsc 2021.