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Three-beam convergent-beam electron diffraction for measuring crystallographic phases
Under almost all circumstances, electron diffraction patterns contain information about the phases of structure factors, a consequence of the short wavelength of an electron and its strong Coulombic interaction with matter. However, extracting this information remains a challenge and no generic meth...
Gorde:
| Argitaratua izan da: | IUCrJ |
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| Egile Nagusiak: | , , |
| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
International Union of Crystallography
2018
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6211523/ https://ncbi.nlm.nih.gov/pubmed/30443359 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252518012216 |
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