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Fabrication and Characterization of Oxygenated AlN/4H-SiC Heterojunction Diodes

The effects of rapid thermal annealing (RTA) on Schottky barrier diodes (SBDs) made from oxygenated aluminum nitride (AlN) thin films deposited on a silicon carbide (SiC) substrate using radio frequency sputtering were investigated. The annealed SBD devices exhibited a 10x increase in the on/off cur...

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Detalhes bibliográficos
Publicado no:Materials (Basel)
Main Authors: Kim, Dong-Hyeon, Min, Seong-Ji, Oh, Jong-Min, Koo, Sang-Mo
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2020
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7579660/
https://ncbi.nlm.nih.gov/pubmed/33003505
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/ma13194335
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