A carregar...

Wafer Bonding of SiC-AlN at Room Temperature for All-SiC Capacitive Pressure Sensor

Wafer bonding of a silicon carbide (SiC) diaphragm to a patterned SiC substrate coated with aluminum nitride (AlN) film as an insulating layer is a promising choice to fabricate an all-SiC capacitive pressure sensor. To demonstrate the bonding feasibility, a crystalline AlN film with a root-mean-squ...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:Micromachines (Basel)
Main Authors: Mu, Fengwen, Xu, Yang, Shin, Seongbin, Wang, Yinghui, Xu, Hengyu, Shang, Haiping, Sun, Yechao, Yue, Lei, Tsuyuki, Tatsurou, Suga, Tadatomo, Wang, Weibing, Chen, Dapeng
Formato: Artigo
Idioma:Inglês
Publicado em: MDPI 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6843128/
https://ncbi.nlm.nih.gov/pubmed/31547592
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/mi10100635
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!