Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping

[Image: see text] Visualizing charge carrier flow over interfaces or near surfaces meets great challenges concerning resolution and vastly different time scales of bulk and surface dynamics. Ultrafast or four-dimensional scanning electron microscopy (USEM) using a laser pump electron probe scheme ci...

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Bibliographic Details
Published in:J Phys Chem Lett
Main Authors: Garming, Mathijs W. H., Bolhuis, Maarten, Conesa-Boj, Sonia, Kruit, Pieter, Hoogenboom, Jacob P.
Format: Artigo
Language:Inglês
Published: American Chemical Society 2020
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC7569669/
https://ncbi.nlm.nih.gov/pubmed/32909435
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jpclett.0c02345
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