A carregar...
Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping
[Image: see text] Visualizing charge carrier flow over interfaces or near surfaces meets great challenges concerning resolution and vastly different time scales of bulk and surface dynamics. Ultrafast or four-dimensional scanning electron microscopy (USEM) using a laser pump electron probe scheme ci...
Na minha lista:
| Publicado no: | J Phys Chem Lett |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
American Chemical
Society
2020
|
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7569669/ https://ncbi.nlm.nih.gov/pubmed/32909435 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jpclett.0c02345 |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|