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Photoemission sources and beam blankers for ultrafast electron microscopy

Observing atomic motions as they occur is the dream goal of ultrafast electron microscopy (UEM). Great progress has been made so far thanks to the efforts of many scientists in developing the photoemission sources and beam blankers needed to create short pulses of electrons for the UEM experiments....

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:Struct Dyn
Päätekijät: Zhang, Lixin, Hoogenboom, Jacob P., Cook, Ben, Kruit, Pieter
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: American Crystallographic Association 2019
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC6764838/
https://ncbi.nlm.nih.gov/pubmed/31592440
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.5117058
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