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Scanning ultrafast electron microscopy
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the trans...
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| Main Authors: | , , |
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| Format: | Artigo |
| Language: | Inglês |
| Published: |
National Academy of Sciences
2010
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| Subjects: | |
| Online Access: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2930532/ https://ncbi.nlm.nih.gov/pubmed/20696933 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1009321107 |
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