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Four-dimensional ultrafast electron microscopy
Electron microscopy is arguably the most powerful tool for spatial imaging of structures. As such, 2D and 3D microscopies provide static structures with subnanometer and increasingly with ångstrom-scale spatial resolution. Here we report the development of 4D ultrafast electron microscopy, whose cap...
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| Main Authors: | , , |
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| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
National Academy of Sciences
2005
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| Teme: | |
| Online dostop: | https://ncbi.nlm.nih.gov/pmc/articles/PMC1129142/ https://ncbi.nlm.nih.gov/pubmed/15883380 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.0502607102 |
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