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Photon gating in four-dimensional ultrafast electron microscopy
Ultrafast electron microscopy (UEM) is a pivotal tool for imaging of nanoscale structural dynamics with subparticle resolution on the time scale of atomic motion. Photon-induced near-field electron microscopy (PINEM), a key UEM technique, involves the detection of electrons that have gained energy f...
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| Publicado no: | Proc Natl Acad Sci U S A |
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| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
National Academy of Sciences
2015
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4620897/ https://ncbi.nlm.nih.gov/pubmed/26438835 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.1517942112 |
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