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Pulse length, energy spread, and temporal evolution of electron pulses generated with an ultrafast beam blanker

Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternative to direct pulsed laser illumination of the sou...

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Detalhes bibliográficos
Publicado no:Struct Dyn
Main Authors: Weppelman, I. G. C., Moerland, R. J., Zhang, L., Kieft, E., Kruit, P., Hoogenboom, J. P.
Formato: Artigo
Idioma:Inglês
Publicado em: American Crystallographic Association 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6486391/
https://ncbi.nlm.nih.gov/pubmed/31065571
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.5089517
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