Zhang, L., Hoogenboom, J. P., Cook, B., & Kruit, P. (2019). Photoemission sources and beam blankers for ultrafast electron microscopy. Struct Dyn.
Παραπομπή Chicago StyleZhang, Lixin, Jacob P. Hoogenboom, Ben Cook, και Pieter Kruit. "Photoemission Sources and Beam Blankers for Ultrafast Electron Microscopy." Struct Dyn 2019.
Παραπομπή MLAZhang, Lixin, Jacob P. Hoogenboom, Ben Cook, και Pieter Kruit. "Photoemission Sources and Beam Blankers for Ultrafast Electron Microscopy." Struct Dyn 2019.
Πρόσοχή: Οι παραπομπές μπορεί να μην είναι 100% ακριβείς.