APA citiranje

Garming, M. W. H., Bolhuis, M., Conesa-Boj, S., Kruit, P., & Hoogenboom, J. P. (2020). Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping. J Phys Chem Lett.

Citação norma Chicago

Garming, Mathijs W. H., Maarten Bolhuis, Sonia Conesa-Boj, Pieter Kruit, and Jacob P. Hoogenboom. "Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping." J Phys Chem Lett 2020.

MLA citiranje

Garming, Mathijs W. H., et al. "Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping." J Phys Chem Lett 2020.