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Lock-in Ultrafast Electron Microscopy Simultaneously Visualizes Carrier Recombination and Interface-Mediated Trapping
[Image: see text] Visualizing charge carrier flow over interfaces or near surfaces meets great challenges concerning resolution and vastly different time scales of bulk and surface dynamics. Ultrafast or four-dimensional scanning electron microscopy (USEM) using a laser pump electron probe scheme ci...
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| Gepubliceerd in: | J Phys Chem Lett |
|---|---|
| Hoofdauteurs: | , , , , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
American Chemical
Society
2020
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| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7569669/ https://ncbi.nlm.nih.gov/pubmed/32909435 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.jpclett.0c02345 |
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