Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments

Nanoprobe X-ray diffraction (nXRD) using focused synchrotron radiation is a powerful technique to study the structural properties of individual semiconductor nanowires. However, when performing the experiment under ambient conditions, the required high X-ray dose and prolonged exposure times can lea...

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Shranjeno v:
Bibliografske podrobnosti
izdano v:J Synchrotron Radiat
Main Authors: Al Hassan, Ali, Lähnemann, Jonas, Davtyan, Arman, Al-Humaidi, Mahmoud, Herranz, Jesús, Bahrami, Danial, Anjum, Taseer, Bertram, Florian, Dey, Arka Bikash, Geelhaar, Lutz, Pietsch, Ullrich
Format: Artigo
Jezik:Inglês
Izdano: International Union of Crystallography 2020
Teme:
Research Papers
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC7467348/
https://ncbi.nlm.nih.gov/pubmed/32876594
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577520009789
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