Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging

Coherent X-ray diffraction imaging at symmetric hhh Bragg reflections was used to resolve the structure of GaAs/In(0.15)Ga(0.85)As/GaAs core–shell–shell nanowires grown on a silicon (111) substrate. Diffraction amplitudes in the vicinity of GaAs 111 and GaAs 333 reflections were used to reconstruct...

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Detalhes bibliográficos
Publicado no:J Appl Crystallogr
Main Authors: Davtyan, Arman, Krause, Thilo, Kriegner, Dominik, Al-Hassan, Ali, Bahrami, Danial, Mostafavi Kashani, Seyed Mohammad, Lewis, Ryan B., Küpers, Hanno, Tahraoui, Abbes, Geelhaar, Lutz, Hanke, Michael, Leake, Steven John, Loffeld, Otmar, Pietsch, Ullrich
Formato: Artigo
Idioma:Inglês
Publicado em: International Union of Crystallography 2017
Assuntos:
Research Papers
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5458586/
https://ncbi.nlm.nih.gov/pubmed/28656032
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576717004149
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