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Threefold rotational symmetry in hexagonally shaped core–shell (In,Ga)As/GaAs nanowires revealed by coherent X-ray diffraction imaging
Coherent X-ray diffraction imaging at symmetric hhh Bragg reflections was used to resolve the structure of GaAs/In(0.15)Ga(0.85)As/GaAs core–shell–shell nanowires grown on a silicon (111) substrate. Diffraction amplitudes in the vicinity of GaAs 111 and GaAs 333 reflections were used to reconstruct...
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| Wydane w: | J Appl Crystallogr |
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| Główni autorzy: | , , , , , , , , , , , , , |
| Format: | Artigo |
| Język: | Inglês |
| Wydane: |
International Union of Crystallography
2017
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| Hasła przedmiotowe: | |
| Dostęp online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5458586/ https://ncbi.nlm.nih.gov/pubmed/28656032 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576717004149 |
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