Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments

af Al Hassan, Ali, Lähnemann, Jonas, Davtyan, Arman, Al-Humaidi, Mahmoud, Herranz, Jesús, Bahrami, Danial, Anjum, Taseer, Bertram, Florian, Dey, Arka Bikash, Geelhaar, Lutz, Pietsch, Ullrich
Udgivet i J Synchrotron Radiat (2020)