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Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments
Nanoprobe X-ray diffraction (nXRD) using focused synchrotron radiation is a powerful technique to study the structural properties of individual semiconductor nanowires. However, when performing the experiment under ambient conditions, the required high X-ray dose and prolonged exposure times can lea...
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| 發表在: | J Synchrotron Radiat |
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| Main Authors: | , , , , , , , , , , |
| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
International Union of Crystallography
2020
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| 主題: | |
| 在線閱讀: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7467348/ https://ncbi.nlm.nih.gov/pubmed/32876594 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577520009789 |
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