A carregar...

Molecular mechanisms of atomic layer etching of cobalt with sequential exposure to molecular chlorine and diketones

The mechanism of thermal dry etching of cobalt films is discussed for a thermal process utilizing sequential exposures to chlorine gas and a diketone [either 1,1,1,5,5,5-hexafluoro-2,4-pentanedione (hexafluoroacetylacetone, hfacH) or 2,4-pentanedione (acetylacetone, acacH)]. The process can be optim...

ver descrição completa

Na minha lista:
Detalhes bibliográficos
Publicado no:J Vac Sci Technol A
Main Authors: Konh, Mahsa, He, Chuan, Lin, Xi, Guo, Xiangyu, Pallem, Venkateswara, Opila, Robert L., Teplyakov, Andrew V., Wang, Zijian, Yuan, Bo
Formato: Artigo
Idioma:Inglês
Publicado em: American Vacuum Society 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6396405/
https://ncbi.nlm.nih.gov/pubmed/30940989
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1116/1.5082187
Tags: Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!