A carregar...
Direct Measurement of Polarization-Induced Fields in GaN/AlN by Nano-Beam Electron Diffraction
The built-in piezoelectric fields in group III-nitrides can act as road blocks on the way to maximizing the efficiency of opto-electronic devices. In order to overcome this limitation, a proper characterization of these fields is necessary. In this work nano-beam electron diffraction in scanning tra...
Na minha lista:
| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2016
|
| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4923855/ https://ncbi.nlm.nih.gov/pubmed/27350322 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep28459 |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|