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Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air
Frequency-modulation atomic force microscopy has turned into a well-established method to obtain atomic resolution on flat surfaces, but is often limited to ultra-high vacuum conditions and cryogenic temperatures. Measurements under ambient conditions are influenced by variations of the dew point an...
Uloženo v:
| Vydáno v: | Beilstein J Nanotechnol |
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| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Beilstein-Institut
2016
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4901554/ https://ncbi.nlm.nih.gov/pubmed/27335735 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.7.38 |
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