Beyer, H., Wagner, T., & Stemmer, A. (2016). Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air. Beilstein J Nanotechnol.
Citación estilo ChicagoBeyer, Hannes, Tino Wagner, and Andreas Stemmer. "Length-extension Resonator As a Force Sensor for High-resolution Frequency-modulation Atomic Force Microscopy in Air." Beilstein J Nanotechnol 2016.
Cita MLABeyer, Hannes, Tino Wagner, and Andreas Stemmer. "Length-extension Resonator As a Force Sensor for High-resolution Frequency-modulation Atomic Force Microscopy in Air." Beilstein J Nanotechnol 2016.
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