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High-frequency multimodal atomic force microscopy
Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenie...
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| Publicado no: | Beilstein J Nanotechnol |
|---|---|
| Main Authors: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Beilstein Institute
2014
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4311654/ https://ncbi.nlm.nih.gov/pubmed/25671141 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.5.255 |
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