Laddar...
High-frequency multimodal atomic force microscopy
Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenie...
Sparad:
| I publikationen: | Beilstein J Nanotechnol |
|---|---|
| Huvudupphovsmän: | , , , |
| Materialtyp: | Artigo |
| Språk: | Inglês |
| Publicerad: |
Beilstein Institute
2014
|
| Ämnen: | |
| Länkar: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4311654/ https://ncbi.nlm.nih.gov/pubmed/25671141 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.5.255 |
| Taggar: |
Lägg till en tagg
Inga taggar, Lägg till första taggen!
|