Loading...
High-frequency multimodal atomic force microscopy
Multifrequency atomic force microscopy imaging has been recently demonstrated as a powerful technique for quickly obtaining information about the mechanical properties of a sample. Combining this development with recent gains in imaging speed through small cantilevers holds the promise of a convenie...
Na minha lista:
| Udgivet i: | Beilstein J Nanotechnol |
|---|---|
| Main Authors: | , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Beilstein Institute
2014
|
| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4311654/ https://ncbi.nlm.nih.gov/pubmed/25671141 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.5.255 |
| Tags: |
Tilføj Tag
Ingen Tags, Vær først til at tagge denne postø!
|