Loading...
Modeling noncontact atomic force microscopy resolution on corrugated surfaces
Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO(2) as a specific case....
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Artigo |
| Language: | Inglês |
| Published: |
Beilstein-Institut
2012
|
| Subjects: | |
| Online Access: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3323912/ https://ncbi.nlm.nih.gov/pubmed/22496996 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.26 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|