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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
Frequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for better stability. This approach inevitably tra...
Kaydedildi:
| Yayımlandı: | Beilstein J Nanotechnol |
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| Asıl Yazarlar: | , , , , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Beilstein-Institut
2015
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4685916/ https://ncbi.nlm.nih.gov/pubmed/26734511 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.6.225 |
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