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Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy
Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated. The resulting electrostatic force or force gradient is detected via lock-in techniques...
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| Publicat a: | Beilstein J Nanotechnol |
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| Autors principals: | , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Beilstein-Institut
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7308609/ https://ncbi.nlm.nih.gov/pubmed/32596095 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.11.76 |
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