Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination

The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by phys...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Jaafar, Miriam, Iglesias-Freire, Oscar, Serrano-Ramón, Luis, Ibarra, Manuel Ricardo, de Teresa, Jose Maria, Asenjo, Agustina
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Beilstein-Institut 2011
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Full Research Paper
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC3190625/
https://ncbi.nlm.nih.gov/pubmed/22003461
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.2.59
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